This event is endorsed
and organized by

6th International Conference on Digital Forensics & Cyber Crime

September 18–20, 2014 | New Haven, Connecticut, United States

General Chair - ICDF2C and SADFE

Ibrahim Baggili, University of New Haven, Director of UNHcFREG

ICDF2C TPC Chairs

Frank Breitinger, University of New Haven

Joshua I. James, Digital Forensic Investigation Research Laboratory, Soon Chun Hyang University

SADFE TPC Chairs

Andrew Marrington, Zayed University

Ricci Ieong, University of Hong Kong

Grey Eminence

Eugene Spafford, CERIAS, Purdue University

Publicity Chair

David Baker, MITRE

TPC Members

Frank Adelstein, ATC-NY

Irfan Ahmed, University of New Orleans

Ibrahim Baggili, University of New Haven (UNHcFREG)

Dave Baker, MITRE

Nicole Beebe, University of Texas at San Antonio

Harlan Carvey, Dell SecureWorks

K P Chow, University of Hong Kong

Fred Cohen, Management Analytics

Dave Dampier, Mississippi State University

Glenn Dardick, Longwood University

Barbara Endicott-Popovsky, University of Washington

Ernest Foo, Queensland University of Technology

Simson Garfinkel, Naval Postgraduate School

Pavel Gladysehv, University College Dublin

Farkhund Iqbal, Zayed University

Meng-Chow Kang, Cisco Systems, Inc

Thomas Kemmerich, University of Bremen, IS-Bremen

Michael Losavio, University of Louisville

James Lyles, NIST

Richard Mislan, Rochester Institute of Technology

Stig Mjolsnes, Norwegian Univ. of Science and Technology NTNU

David Naccache, Panthéon-Assas University

Bruce Nikkel, Director of IT and Forensics

Martin Olivier ICSA, University of Pretoria

Marcus Rogers, Purdue

Vassil Roussev, University of New Orleans

Neil Rowe, U.S. Naval Postgraduate School

Shahzad Saleem, Stockholm University

Bradley Schatz, Queensland University of Technology, Australia

Kathryn Seigfried-Spellar, The University of Alabama

Hossain Shahriar, Kennesaw State University

Jill Slay, Australian Centre for Cyber Security

Timothy Vidas, Carnegie Mellon University

David Wolinsky, Yale University

York Yannikos, Fraunhofer SIT